Effect of current sweep rate on critical current of superconducting Ag-Bi-2223 tapes

Cryogenics

Volumn 38, Issue 8, 1998, Pages 809-812

  Ding, S Y ^a   Ren, C ^a   Yao, X X ^a   Sun, Y ^b   Zhang, H ^b  

^a NANJING UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

2223 tape; Ag b; Ic; Measurement; V I curve

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; VOLTAGE MEASUREMENT;

CURRENT SWEEP RATE; SUPERCONDUCTING TAPES;

SUPERCONDUCTING DEVICES;

EID: 0032132059     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(98)00072-1     Document Type: Article

References (10)

1. Goldschmidt, D., Phys. Rev. B, 1989, 39, 9139-9146.
2. Coclogh, M.S., Abell, J.S., Gough, C.E., Rickets, J., Schields, T., Wellhofer, F., Winen, W.F., Alfod, McN. and Botten, T., Cryogenics, 1990, 30, 439-444.
3. Meisels, R., Bungre, S.S. and Capline, A.D., J. Less Common Materials, 1989, 151, 83-88; Goldrich, L.F., Cryogenics, 1991, 31, 720-727.
4. Meisels, R., Bungre, S.S. and Capline, A.D., J. Less Common Materials, 1989, 151, 83-88; Goldrich, L.F., Cryogenics, 1991, 31, 720-727.
5. Goldrich, L.F., Cryogenics, 1991, 31, 720-727.
6. Goodrich, L.F., Wiejaczka, J.A., Srivastava, A.N., Stauffer, T.C. and Medina, L.T., IEEE Trans. Appl. Supercond., 1995, 5, 552.
7. Itoh, K., Murakami, Y., Yuyama, M. and Wada, H., IEEE Trans. Appl. Supercond., 1995, 5, 545.
8. Hua, C.Y., Duan, Z.Z., Guo, S.Q., Cao, C.L., Wang, C.Y., Ding, S.Y., Sun, Y., Zhou, Q. and Yang, Q.S., Physica, 1997, 2615, C282-287.
9. Goodrich, L.F., Wiejaczka, J.A. and Srivastava, A.N., IEEE Trans on Appl. Supercond., 1995, 5, 548.
10. Weijers, H.W. and Van Sciver, S.W., IEEE Trans. Appl. Supercond., 1995, 5, 552.