Dynamic response of Ag-Bi2223 tapes in applied fields by electric transport measurement

Cryogenics

Volumn 40, Issue 1, 2000, Pages 29-34

  Zhang, Y H ^a,b   Ding, S Y ^a   Luo, H ^a   Wu, X F ^a   Zhang, P ^a   Lin, F Y ^a   Qiu, L ^a   Xu, Z ^a   Yao, X X ^a  

^a NANJING UNIVERSITY   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Ag Bi2223 tapes; Critical current; Critical current parameter n; V I curves

Indexed keywords

EID: 0001828591     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(00)00004-7     Document Type: Article

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