SCOPUS 정보 검색 플랫폼

Journal of Superconductivity and Novel Magnetism

Volumn 13, Issue 3, 2000, Pages 453-458

Voltage relaxation and its influence on critical current measurements

(9) Ding, S Y a Luo, H a Zhang, Y H a Ding, Q a Ling, F Y a Zhang, P a Wu, X F a Qiu, L a Yao, X X a

a School of Electronic Science and Engineering (China)

Author keywords

Ag Bi2223 tapes; Ic measurement; V t curve

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; MATHEMATICAL MODELS; MAXWELL EQUATIONS; OXIDE SUPERCONDUCTORS;

COLLECTIVE CREEP MODEL; CRITICAL CURRENT MEASUREMENT; ELECTRIC TRANSPORT MEASUREMENTS; VOLTAGE RELAXATION;

MAGNETIC TAPE;

EID: 0034204725 PISSN: 15571939 EISSN: 15571947 Source Type: Journal
DOI: None Document Type: Article

Times cited : (8)

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