Effect of electric field relaxation on the V-I curve

Superconductor Science and Technology

Volumn 12, Issue 8, 1999, Pages 571-576

  Zhang, P ^a   Ren, C ^a   Ding, S Y ^a   Ding, Q ^a   Lin, F Y ^a   Zhang, Y H ^a   Luo, H ^a   Yao, X X ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC VARIABLES MEASUREMENT; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC RELAXATION; MAGNETIC TAPE; NONLINEAR EQUATIONS; NUMERICAL ANALYSIS;

ELECTRIC FIELD RELAXATION; ELECTRIC TRANSPORT MEASUREMENT; NONLINEAR ELECTRIC FIELD DIFFUSION EQUATION; SWEEPING RATE;

ELECTRIC FIELD EFFECTS;

EID: 0032654299     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/8/316     Document Type: Article

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