Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 9, Issue 3, 2001, Pages 450-460

  Jin, Woojin ^b   Eo, Yungseon ^b   Eisenstadt, William R ^a,c   Shim, Jongin ^b  

^a IEEE   (United States)

^b Hanyang University   (South Korea)

^c University of Florida   (United States)

Author keywords

Crosstalk; Interconnect capacitance; Multilayer; Shielding effect; Signal delay; VLSI interconnects

Indexed keywords

SIGNAL DELAY; VLSI INTERCONNECTS;

CAPACITANCE; COST EFFECTIVENESS; CROSSTALK; INTERCONNECTION NETWORKS; MULTILAYERS; SHIELDING;

VLSI CIRCUITS;

EID: 0035361132     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.929579     Document Type: Article

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