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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4423-4429

Attenuated total reflection-scanning near-field Raman spectroscopy

(2) Futamata, Masayuki a Bruckbauer, Andreas b

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

b JT RES CENTER FOR ATOM TECHNOLOGY (Japan)

Author keywords

Attenuated total reflection; SNOM; Surface enhanced Raman scattering (SERS); Surface plasmon polariton

Indexed keywords

COPPER COMPOUNDS; LIGHT REFLECTION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THIN FILMS;

ATTENUATED TOTAL REFLECTION (ATR);

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 0035357724 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.4423 Document Type: Article

Times cited : (12)

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