Bulk crystals to surfaces: Combining X-ray diffraction and atomic force microscopy to probe the structure and formation of crystal interfaces

Chemical Reviews

Volumn 101, Issue 6, 2001, Pages 1697-1725

  Ward, Michael D ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; NUCLEATION; REACTION KINETICS; SINGLE CRYSTALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTAL STRUCTURE;

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; REVIEW; X RAY CRYSTALLOGRAPHY;

CRYSTALLIZATION; CRYSTALLOGRAPHY, X-RAY; MICROSCOPY, ATOMIC FORCE;

EID: 0035354586     PISSN: 00092665     EISSN: None     Source Type: Journal    
DOI: 10.1021/cr000020j     Document Type: Review

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