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Volumn 89, Issue 9, 2001, Pages 5215-5218

Growth and characterization of GaAs epitaxial layers on Si/porous Si/Si substrate by chemical beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035340886     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1362339     Document Type: Article
Times cited : (13)

References (15)
  • 6
    • 0004140205 scopus 로고    scopus 로고
    • INSPEC, The Institution of Electrical Engineers, London
    • L. Canham, Properties of Porous Silicon (INSPEC, The Institution of Electrical Engineers, London, 1997).
    • (1997) Properties of Porous Silicon
    • Canham, L.1
  • 8
  • 9


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.