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Volumn 224, Issue 3-4, 2001, Pages 316-322

Growth of high-quality InSb films on Si(1 1 1) substrates without buffer layers

Author keywords

A1. Crystal structure; A1. Heteroepitaxy; A1. Reflection high energy electron diffraction; A3. Molecular beam epitaxy; B2. Semiconducting III V materials

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; ELECTRON MOBILITY; FILM GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; THERMAL EFFECTS;

EID: 0035306040     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01018-1     Document Type: Article
Times cited : (9)

References (21)
  • 21
    • 0004958349 scopus 로고
    • Under Graduate Thesis, Toyama University, Japan, March, submitted
    • (1993)
    • Mori, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.