|
Volumn 224, Issue 3-4, 2001, Pages 316-322
|
Growth of high-quality InSb films on Si(1 1 1) substrates without buffer layers
|
Author keywords
A1. Crystal structure; A1. Heteroepitaxy; A1. Reflection high energy electron diffraction; A3. Molecular beam epitaxy; B2. Semiconducting III V materials
|
Indexed keywords
CRYSTAL STRUCTURE;
ELECTRIC PROPERTIES;
ELECTRON MOBILITY;
FILM GROWTH;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR GROWTH;
THERMAL EFFECTS;
HETEROEPITAXY;
INDIUM ANTIMONIDE;
SEMICONDUCTING FILMS;
|
EID: 0035306040
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01018-1 Document Type: Article |
Times cited : (9)
|
References (21)
|