Reconstructions of 6H-SiC(0001) surfaces studied by scanning tunneling microscopy and reflection high-energy electron diffraction

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 4 A, 2001, Pages 2211-2216

  Hisada, Y ^a   Hayashi, K ^a   Kato, K ^a   Aoyama, T ^a   Mukainakano, S ^a   Ichimiya, A ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

6H SiC; Reconstruction; Reflection high energy electron diffraction; RHEED; Scanning tunneling microscopy; STM

Indexed keywords

ANNEALING; CRYSTAL LATTICES; GRAPHITE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

SURFACE DECOMPOSITIONS; SURFACE RECONSTRUCTIONS;

SILICON CARBIDE;

EID: 0035301710     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.2211     Document Type: Article

References (18)