Aligned carbon nanotube film self-organized on a SiC wafer

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 5 B, 1998, Pages

  Kusunoki, M ^a   Shibata, J ^a   Rokkaku, M ^a   Hirayama, T ^a  

^a JAPAN FINE CERAMICS CENTER   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; FILMS; HIGH TEMPERATURE EFFECTS; SILICON CARBIDE; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

FIELD EMISSION;

NANOSTRUCTURED MATERIALS;

EID: 0032068830     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l605     Document Type: Article

References (10)