Surface analysis of 6H-SiC

Surface Science

Volumn 365, Issue 2, 1996, Pages 443-452

  Van Elsbergen, V ^a   Kampen, T U ^a   Monch W ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Auger electron spectroscopy; Low energy electron diffraction (LEED); Silicon carbide; Soft X ray photoelectron spectroscopy; Surface relaxation and reconstruction; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; ATOMS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL BONDS; CLEANING; LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; THERMAL EFFECTS; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE RECONSTRUCTION; ULTRAHIGH VACUUM;

SILICON CARBIDE;

EID: 0030243329     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00707-8     Document Type: Article

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