Thermally stable Nb and Nb/Au ohmic contacts to p-GaN

Journal of Electronic Materials

Volumn 30, Issue 3, 2001, Pages 266-270

  Kim, Han Ki ^a   Seong, Tae Yeon ^a   Lee, Cheul Ro ^b  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b Chonbuk National University   (South Korea)

Author keywords

Au; Nb; Ohmic contacts; P GaN; Schottky barrier heights

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRIC RESISTANCE MEASUREMENT; GOLD; METALLIZING; MORPHOLOGY; NIOBIUM; OHMIC CONTACTS; THERMAL EFFECTS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

SCHOTTKY BARRIER HEIGHTS; VAN DER PAUW GEOMETRY;

GALLIUM NITRIDE;

EID: 0035271578     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-001-0027-x     Document Type: Article

References (18)