메뉴 건너뛰기




Volumn 222, Issue 1-2, 2001, Pages 183-193

Model of boron incorporation into silicon epitaxial film in a B2H6-SiHCl3-H2 system

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; CARRIER COMMUNICATION; CHEMISORPTION; DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; HYDROGEN; RATE CONSTANTS; SEMICONDUCTOR GROWTH; SILICON WAFERS;

EID: 0035151895     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00911-8     Document Type: Article
Times cited : (7)

References (52)
  • 27
    • 0009728407 scopus 로고
    • in: S.P. Keller (Ed.), North-Holand, Amsterdam
    • H.B. Pogge, in: S.P. Keller (Ed.), Handbook on Semiconductor, Vol.3, p. 335 North-Holand, Amsterdam, 1980.
    • (1980) Handbook on Semiconductor , vol.3 , pp. 335
    • Pogge, H.B.1
  • 51
    • 0040048585 scopus 로고
    • M.L. Hitchman, K.F. Jensen(Eds.), Academic Press, London, (Chapter 4)
    • M.L. Hitchman, K.H. Jensen, in: Chemical Vapor Deposition, M.L. Hitchman, K.F. Jensen(Eds.), Academic Press, London, 1993, (Chapter 4), p. 164.
    • (1993) In: Chemical Vapor Deposition , pp. 164
    • Hitchman, M.L.1    Jensen, K.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.