SCOPUS 정보 검색 플랫폼

Volumn 353-356, Issue , 2001, Pages 475-478

Tantalum and tungsten in silicon carbide: identification and polytype dependence of deep levels

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON ENERGY LEVELS; ENERGY GAP; RADIOACTIVE TRACERS; RADIOISOTOPES; TANTALUM; TUNGSTEN;

BAND GAP STATES; BAND OFFSET; CHEMICAL IDENTIFICATION; LEVEL SPLITTING; POLYTYPE; POLYTYPE DEPENDENCE; RULE OF LANGER-HEINRICH;

SILICON CARBIDE;

EID: 0035119596 PISSN: 02555476 EISSN: None Source Type: Conference Proceeding
DOI: 10.4028/www.scientific.net/msf.353-356.475 Document Type: Article

Times cited : (6)

References (13)

1
- 0031268783
- E.N. Mokhov, M.G. Ramm, A.D. Roenkov, Yu.A. Vodakov, J. Cryst. Growth 181 (1997) p.254.
- (1997) J. Cryst. Growth , vol.181 , pp. 254
- Mokhov, E.N.¹ Ramm, M.G.² Roenkov, A.D.³ Vodakov, Yu.A.⁴

2
- 0031513697
- Yu.A. Vodakov, A.D. Roenkov, M.G. Ramm, E.N. Mokhov, Yu.N. Makarov, Phys. Stat. Sol. (b) 202 (1997), p. 177.
- (1997) Phys. Stat. Sol. (B) , vol.202 , pp. 177
- Vodakov, Yu.A.¹ Roenkov, A.D.² Ramm, M.G.³ Mokhov, E.N.⁴ Makarov, Yu.N.⁵

3
- 0009010268
- D. Hoffmann, S.Yu. Karpov, Yu.N. Makarov, E.N. Mokhov, M.G. Ramm, M.S. Ramm, A.D. Roenkov, Yu.A. Vodakov, Inst. Phys. Conf. Ser. 142 (1996), p.29.
- (1996) Inst. Phys. Conf. Ser. , vol.142 , pp. 29
- Hoffmann, D.¹ Karpov, S.Yu.² Makarov, Yu.N.³ Mokhov, E.N.⁴ Ramm, M.G.⁵ Ramm, M.S.⁶ Roenkov, A.D.⁷ Vodakov, Yu.A.⁸

4
- 0346951425
- L.B. Rowland and G.T. Dunne, Mater. Sci. Forum (2000), p.338.
- (2000) Mater. Sci. Forum , pp. 338
- Rowland, L.B.¹ Dunne, G.T.²

5
- 0005022867
- N. Achtziger, J. Grillenberger, and W. Witthuhn, Hyperfine Interactions 120/121 (1999), p.69.
- (1999) Hyperfine Interactions , vol.120-121 , pp. 69
- Achtziger, N.¹ Grillenberger, J.² Witthuhn, W.³

6
- 84889123456
- at press
- J. Grillenberger, N. Achtziger, R. Sielemann, and W. Witthuhn, J. Appl. Phys. 80 (2000), at press.
- (2000) J. Appl. Phys. , vol.80
- Grillenberger, J.¹ Achtziger, N.² Sielemann, R.³ Witthuhn, W.⁴

7
- 84889152215
- N. Achtziger, G. Pasold, R. Sielemann, C. Hülsen, J. Grillenberger, W. Witthuhn, Phys.Rev.B.
- Phys.Rev.B
- Achtziger, N.¹ Pasold, G.² Sielemann, R.³ Hülsen, C.⁴ Grillenberger, J.⁵ Witthuhn, W.⁶

8
- 3543057120
- J.M. Langer and H. Heinrich, Phys.Rev.Lett. 55(13), (1997), p.1414.
- (1997) Phys.Rev.Lett. , vol.55 , Issue.13 , pp. 1414
- Langer, J.M.¹ Heinrich, H.²

9
- 3743086085
- N. Achtziger, J. Grillenberger, W. Witthuhn, Mater. Sci. Forum Vols. 264-268, (1998), p.541.
- (1998) Mater. Sci. Forum , vol.264-268 , pp. 541
- Achtziger, N.¹ Grillenberger, J.² Witthuhn, W.³

10
- 36449005143
- N. Achtziger, H. Gottschalk, T. Licht, J. Meier, M. Rüb, U. Reislöhner, W. Witthuhn, Appl.Phys.Lett. 66 (1995),p.2370
- (1995) Appl.Phys.Lett. , vol.66 , pp. 2370
- Achtziger, N.¹ Gottschalk, H.² Licht, T.³ Meier, J.⁴ Rüb, M.⁵ Reislöhner, U.⁶ Witthuhn, W.⁷

11
- 0004052502
- Academic Press, London
- P. Blood and J.W. Orton, The electrical characterization of semiconductors: majority carriers and electron states, (Academic Press, London, 1992), p.344 and p. 426.
- (1992) The Electrical Characterization of Semiconductors: Majority Carriers and Electron States , pp. 344
- Blood, P.¹ Orton, J.W.²

12
- 0346398961
- V.V. Afanas'ev, M. Bassler, G. Pensl, M.J. Schulz, and E. Stein von Kamienski, J.Appl.Phys. 79(6) (1996), p3108.
- (1996) J.Appl.Phys. , vol.79 , Issue.6 , pp. 3108
- Afanas'ev, V.V.¹ Bassler, M.² Pensl, G.³ Schulz, M.J.⁴ Stein Von Kamienski, E.⁵

13
- 84889131758
- private communication
- H. Overhof, private communication.
- Overhof, H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.