-
3
-
-
3743155056
-
-
Ch. Zistl, R. Sielemann, H. Hässlein, S. Gall, D. Bräunig and J. Bollmann, Mat. Sci. For. 258-263 (1997) 53.
-
(1997)
Mat. Sci. For.
, vol.258-263
, pp. 53
-
-
Zistl, Ch.1
Sielemann, R.2
Hässlein, H.3
Gall, S.4
Bräunig, D.5
Bollmann, J.6
-
4
-
-
84938312665
-
Defects in Electronic Materials II
-
eds. J. Michel, T. Kennedy, K. Wada and K. Thonke
-
R. Magerle, in: Defects in Electronic Materials II, eds. J. Michel, T. Kennedy, K. Wada and K. Thonke, Mat. Res. Soc. Symp. Proc., Vol. 442 (1997) p. 3.
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.442
, pp. 3
-
-
Magerle, R.1
-
8
-
-
36449005143
-
-
N. Achtziger, H. Gottschalk, T. Licht, J. Meier, M. Rüb, U. Reislöhner and W. Witthuhn, Appl. Phys. Lett. 66 (1995) 2370.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2370
-
-
Achtziger, N.1
Gottschalk, H.2
Licht, T.3
Meier, J.4
Rüb, M.5
Reislöhner, U.6
Witthuhn, W.7
-
9
-
-
0042000461
-
-
M. Lang, G. Pensl, M. Gebhard, N. Achtziger and M. Uhrmacher, Appl. Phys. A 53 (1991) 94.
-
(1991)
Appl. Phys. A
, vol.53
, pp. 94
-
-
Lang, M.1
Pensl, G.2
Gebhard, M.3
Achtziger, N.4
Uhrmacher, M.5
-
11
-
-
0042501308
-
-
eds. M. Scheffler and R. Zimmermann World Scientific, Singapore
-
N. Achtziger, T. Licht, U. Reislöhner, M. Rüb and W. Witthuhn, in: 23rd Internat. Conf. on the Physics of Semiconductors, Vol. 4, eds. M. Scheffler and R. Zimmermann (World Scientific, Singapore, 1996) p. 2717.
-
(1996)
23rd Internat. Conf. on the Physics of Semiconductors
, vol.4
, pp. 2717
-
-
Achtziger, N.1
Licht, T.2
Reislöhner, U.3
Rüb, M.4
Witthuhn, W.5
-
15
-
-
0013432640
-
-
J. Grillenberger, N. Achtziger, F. Günther and W. Witthuhn, Appl. Phys. Lett. 73(25) (1998) 3698.
-
(1998)
Appl. Phys. Lett.
, vol.73
, Issue.25
, pp. 3698
-
-
Grillenberger, J.1
Achtziger, N.2
Günther, F.3
Witthuhn, W.4
-
16
-
-
0040889343
-
-
ed. G. Langouche Elsevier, Amsterdam
-
Th. Wichert, N. Achtziger, H. Metzner and R. Sielemann, in: Hyperfine Interaction of Defects in Semiconductors, ed. G. Langouche (Elsevier, Amsterdam, 1992) p. 79.
-
(1992)
Hyperfine Interaction of Defects in Semiconductors
, pp. 79
-
-
Wichert, Th.1
Achtziger, N.2
Metzner, H.3
Sielemann, R.4
|