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Volumn 120-121, Issue 1-8, 1999, Pages 69-79

Radiotracer spectroscopy of deep levels in the semiconductor band gap

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0005022867     PISSN: 03043843     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (16)
  • 4
    • 84938312665 scopus 로고    scopus 로고
    • Defects in Electronic Materials II
    • eds. J. Michel, T. Kennedy, K. Wada and K. Thonke
    • R. Magerle, in: Defects in Electronic Materials II, eds. J. Michel, T. Kennedy, K. Wada and K. Thonke, Mat. Res. Soc. Symp. Proc., Vol. 442 (1997) p. 3.
    • (1997) Mat. Res. Soc. Symp. Proc. , vol.442 , pp. 3
    • Magerle, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.