Radiotracer identification of Ti, V and Cr band gap states in 4H- and 6H-SiC

Materials Science Forum

Volumn 264-268, Issue PART 1, 1998, Pages 541-544

  Achtziger, N ^a   Grillenberger, J ^a   Witthuhn, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Band Offset; Chromium; Deep Levels; DLTS; Titanium; Transition Metal; Vanadium

Indexed keywords

CHROMIUM; CRYSTAL LATTICES; DEEP LEVEL TRANSIENT SPECTROSCOPY; ENERGY GAP; RADIOACTIVE TRACERS; RADIOISOTOPES; SEMICONDUCTING SILICON COMPOUNDS; TITANIUM; VANADIUM;

BAND OFFSET;

SILICON CARBIDE;

EID: 3743086085     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.264-268.541     Document Type: Article

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