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Volumn 55, Issue 13, 1985, Pages 1414-1417
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Deep-Level impurities: A possible guide to prediction of band-edge discontinuities in semiconductor heterojunctions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 3543057120
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.55.1414 Document Type: Article |
Times cited : (310)
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References (36)
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