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Volumn 55, Issue 13, 1985, Pages 1414-1417

Deep-Level impurities: A possible guide to prediction of band-edge discontinuities in semiconductor heterojunctions

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EID: 3543057120     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.55.1414     Document Type: Article
Times cited : (310)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.