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Integrated Ferroelectrics

Volumn 35, Issue 1-4, 2001, Pages 229-238

(Zr/Ti) ratio effect on RF magnetron sputtered lead titanate zirconate films

(4) Soyer, C a Haccart, T a Cattan, E a Remiens, D a

a UNIVERSITÉ DE VALENCIENNES (France)

Author keywords

Dielectric; Ferroelectric; Pb(ZrxTi1 x)O3; Rf sputtering; Various (Zr Ti)

Indexed keywords

ANNEALING; COERCIVE FORCE; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRIC PROPERTIES; FERROELECTRICITY; FILM GROWTH; LATTICE CONSTANTS; LEAD COMPOUNDS; MAGNETRON SPUTTERING; PERMITTIVITY MEASUREMENT;

LEAD TITANATE ZIRCONATE; MORPHOTROPIC COMPOSITION;

FERROELECTRIC THIN FILMS;

EID: 0035034448 PISSN: 10584587 EISSN: None Source Type: Journal
DOI: 10.1080/10584580108016904 Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.