Properties variation with composition of single-crystal Pb(ZrxTi1-x)O3 thin films prepared by MOCVD

Materials Research Society Symposium - Proceedings

Volumn 401, Issue , 1996, Pages 139-149

  Foster, C M ^a   Bai, G R ^a   Li, Z ^a   Jammy, R ^a   Wills, L A ^a   Hiskes, R ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL STRUCTURE; DIELECTRIC PROPERTIES; ELECTRODES; ELECTRON SPECTROSCOPY; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION;

ENERGY DISPERSIVE ELECTRON SPECTROSCOPY; FILM THICKNESS; LEAD ZIRCONYL TITANATE; STRONTIUM TITANATE;

THIN FILMS;

EID: 0029752947     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)