Optimized PZT thin films for pyroelectric IR detector arrays

Journal of Electroceramics

Volumn 3, Issue 2, 1999, Pages 151-162

  Bruchhaus, Rainer ^a   Pitzer, Dana ^a   Schreiter, Matthias ^a   Wersing, Wolfram ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; COMPRESSIVE STRESS; ELECTRIC PROPERTIES; ELECTROCHEMICAL ELECTRODES; INFRARED DETECTORS; LEAD COMPOUNDS; PERMITTIVITY; PHASE DIAGRAMS; PHASE TRANSITIONS; POLARIZATION; SPUTTERING; THIN FILMS;

MORPHOTROPIC PHASE BOUNDARY; PYROELECTRIC COEFFICIENT; PYROELECTRIC INFRARED DETECTOR ARRAYS; SELF POLARIZATION;

FERROELECTRIC MATERIALS;

EID: 0032677205     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009995126986     Document Type: Article

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