Investigation of the structural and electrical properties of Sr1-xBi2.2Ta2O9 thin films with deficient Sr contents

Applied Surface Science

Volumn 173, Issue 3-4, 2001, Pages 307-312

  Li, Aidong ^a   Ling, Huiqin ^a   Wu, Di ^a   Yu, Tao ^a   Wang, Mu ^a   Yin, Xiaobo ^a   Liu, Zhiguo ^a   Ming, Naiben ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DECOMPOSITION; ELECTRIC VARIABLES MEASUREMENT; FERROELECTRICITY; FILM PREPARATION; MICROANALYSIS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

INDUCTIVELY COUPLED PLASMA; STRONTIUM BISMUTH TANTALUM OXIDES;

STRONTIUM COMPOUNDS;

EID: 0034836161     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00008-3     Document Type: Article

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