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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Feedback stabilized force-sensors: A gateway to the direct measurement of interaction potentials

(5) Jarvis, S P a Durig U c Lantz, M A a Yamada, H b Tokumoto, H b

a JRCAT (Japan)

b NATL INST FOR ADV INTERDISC RES (Japan)

c IBM RESEARCH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT MEASUREMENTS; DATA INTERPRETATION; DIRECT MEASUREMENT; FORCE CURVE; FORCE GRADIENTS; FORCE INTERACTION; FORCE SENSITIVITY; INTERACTION POTENTIALS; LOCALIZED POINTS; MECHANICAL NOISE; PHYSICAL SYSTEMS; TIP STRUCTURE;

ATOMIC FORCE MICROSCOPY;

SURFACE CHEMISTRY;

EID: 0000734297 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051131 Document Type: Article

Times cited : (17)

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