Thickness control and defects in oriented mesoporous silica films

Journal of Materials Chemistry

Volumn 8, Issue 5, 1998, Pages 1205-1211

  Yang, Hong ^a   Coombs, Neil ^a   Ozin, Geoffrey A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001472209     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/a800004b     Document Type: Article

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