-
1
-
-
0030397730
-
2Large Area Integrated Circuit Consisting of 9 Video Signal-Processors
-
J. Otterstedt, M. Kuboschek, J. Castagne, J. Mucha, "A 16.6 cm2 Large Area Integrated Circuit Consisting of 9 Video Signal-Processors", Proc. Intern. Conf. on Innovative Systems in Silicon, pp. 113-123, 1996.
-
(1996)
Proc. Intern. Conf. on Innovative Systems in Silicon
, pp. 113-123
-
-
Otterstedt, J.1
Kuboschek, M.2
Castagne, J.3
Mucha, J.4
-
2
-
-
0021640294
-
Process Considerations in Restructurable VLSI for Wafer-Scale Integration
-
P. W. Wyatt, J. I. Raffel, G. H. Chapman, B. Mathur, J. A. Burns, T. O. Hemdon, "Process Considerations in Restructurable VLSI for Wafer-Scale Integration", Proc. Int. Electron Devices Meeting, pp. 626-629, 1984.
-
(1984)
Proc. Int. Electron Devices Meeting
, pp. 626-629
-
-
Wyatt, P.W.1
Raffel, J.I.2
Chapman, G.H.3
Mathur, B.4
Burns, J.A.5
Hemdon, T.O.6
-
4
-
-
0034503005
-
Implementation of a Multiprocessor System with Distributed Embedded DRAM on a Large Area Integrated Circuit
-
25-28 October, Yamanashi, Japan
-
K. Herrmann, S. Moch, J. Hilgenstock, P. Pirsch, "Implementation of a Multiprocessor System with Distributed Embedded DRAM on a Large Area Integrated Circuit", Int. Symp. on Defect and Fault Tolerance in VLSI Systems, 25-28 October 2000, Yamanashi, Japan.
-
(2000)
Int. Symp. on Defect and Fault Tolerance in VLSI Systems
-
-
Herrmann, K.1
Moch, S.2
Hilgenstock, J.3
Pirsch, P.4
-
5
-
-
0031630292
-
A Video Signal Processor for MIMD Multiprocessing
-
J. Hilgenstock, K. Herrmann, J. Otterstedt, D. Niggemeyer, P. Pirsch, "A Video Signal Processor for MIMD Multiprocessing", Design Automation Conference (DAC), 1998, pp. 50-55.
-
(1998)
Design Automation Conference (DAC)
, pp. 50-55
-
-
Hilgenstock, J.1
Herrmann, K.2
Otterstedt, J.3
Niggemeyer, D.4
Pirsch, P.5
-
6
-
-
0030121091
-
2Monolithic Large-Area Integrated Multiprocessor System Using Laser Reconfiguration
-
April
-
H.-U. Schröder, J. Otterstedt, and T. Hillmann-Ruge, "Yield Enhancement of a 16.6 cm2 Monolithic Large-Area Integrated Multiprocessor System Using Laser Reconfiguration," IEEE Trans. Comp., Packag., Manufact, Tech. - Part C, Vol. 19, no. 2, April 1996.
-
(1996)
IEEE Trans. Comp., Packag., Manufact, Tech. - Part C
, vol.19
, Issue.2
-
-
Schröder, H.-U.1
Otterstedt, J.2
Hillmann-Ruge, T.3
-
8
-
-
0019027134
-
Built-in Test for Complex Digital Integrated Circuits
-
B. Könemann, J. Mucha, G. Zwiehoff, "Built-in Test for Complex Digital Integrated Circuits", IEEE J. Solid-State Circuits, Vol. 15, No. 3, 1980, pp. 315-318.
-
(1980)
IEEE J. Solid-State Circuits
, vol.15
, Issue.3
, pp. 315-318
-
-
Könemann, B.1
Mucha, J.2
Zwiehoff, G.3
-
9
-
-
0033694263
-
Characterization of Asymmetric Coupled CMOS Lines
-
Boston, MA
-
U. Arz, D. F. Williams, D. K. Walker, J. E. Rogers, M. Rudack, D. Treytnar, H. Grabinski, "Characterization of Asymmetric Coupled CMOS Lines," IEEE MTT-S International Microwave Symposium Digest, pp. 609-612, Boston, MA, 2000.
-
(2000)
IEEE MTT-S International Microwave Symposium Digest
, pp. 609-612
-
-
Arz, U.1
Williams, D.F.2
Walker, D.K.3
Rogers, J.E.4
Rudack, M.5
Treytnar, D.6
Grabinski, H.7
-
10
-
-
0034507773
-
A Multifunctional Laser Linking and Cutting Structure for Standard 0.25 μm CMOS-Technology
-
25-28 October, Yamanashi, Japan
-
O. Mende, M. Redeker, M. Rudack, D. Treytnar, "A Multifunctional Laser Linking and Cutting Structure for Standard 0.25 μm CMOS-Technology", Int. Symp. on Defect and Fault Tolerance in VLSI Systems, 25-28 October 2000, Yamanashi, Japan.
-
(2000)
Int. Symp. on Defect and Fault Tolerance in VLSI Systems
-
-
Mende, O.1
Redeker, M.2
Rudack, M.3
Treytnar, D.4
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