Yield enhancement of a 16.6 cm2 monolithic large-area integrated multiprocessor system using laser reconfiguration

IEEE transactions on components, packaging and manufacturing technology. Part C. Manufacturing

Volumn 19, Issue 2, 1996, Pages 105-109

  Schroeder, Hans Ulrich ^a   Otterstedt, Jan ^a   Hillmann Ruge, Thomas ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; EXCIMER LASERS; FAILURE ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; MULTIPROCESSING SYSTEMS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DEVICE TESTING; STATISTICS; VIDEO SIGNAL PROCESSING;

BLACK EQUATION; LASER RECONFIGURATION; MICROELECTRONIC SYSTEMS; MONOLITHIC LARGE AREA INTEGRATED MULTIPROCESSOR SYSTEM;

MONOLITHIC INTEGRATED CIRCUITS;

EID: 0030121091     PISSN: 10834400     EISSN: None     Source Type: Journal    
DOI: 10.1109/3476.507146     Document Type: Article

References (9)

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