Attractive tapping - A method to minimize topography distortions in tapping mode atomic force microscopy

Probe Microscopy

Volumn 2, Issue 1, 2000, Pages 21-29

  Chen, X ^a   Davies, M C ^a   Roberts, C J ^a   Tendler, S J B ^a   Williams, P M ^a   Davies, J ^a   Dawkes, A C ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

AFM; Image distortion; Tapping mode

Indexed keywords

BOVINE SERUM ALBUMIN; POLYSTYRENE;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; FILM; HEIGHT; IMAGE QUALITY; IMAGING; OSCILLATION; PRESSURE; TOPOGRAPHY;

EID: 0034503415     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

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3. Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation
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5. Phase imaging: Deep or superficial?
6. Chemical and morphological analysis of surface enrichment in a biodegradable polymer blend by phase-detection imaging atomic force microscopy
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8. Energy dissipationin tapping-mode atomic force microscopy
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10. Serum-albumin
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14. Imaging material properties by resonant tapping-force microscopy: A model investigation
15. Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy