Comparison between sram see cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility

IEEE Transactions on Nuclear Science

Volumn 47, Issue 3 PART 1, 2000, Pages 539-544

  Jones, R ^a   Chugg, A M ^a   Jones, Cms ^b   Duncan, P H ^b  

^a Radiation Effects Group

^b Radiation Effects Group   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INSTRUMENT TESTING; ION BEAMS; PERFORMANCE; PULSED LASER APPLICATIONS; RANDOM ACCESS STORAGE;

ION BEAM TESTING; MULTIPLE BYTE MEMORY ERRORS; PICOSECOND PULSED LASER FACILITY;

RADIATION EFFECTS;

EID: 0034207396     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.856477     Document Type: Article

References (10)

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