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Volumn 47, Issue 6 III, 2000, Pages 2269-2275

Defects and nanocrystals generated by Si implantation into a-SiO2

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE MEASUREMENT; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; ELECTRIC CHARGE; ELECTRON SPIN RESONANCE SPECTROSCOPY; NANOSTRUCTURED MATERIALS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING SILICON; SILICA; TRANSMISSION ELECTRON MICROSCOPY; VOLTAGE MEASUREMENT;

EID: 0034451094     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903764     Document Type: Conference Paper
Times cited : (40)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.