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Volumn 618, Issue , 2000, Pages 123-128
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Stability of ensembles of Ge/Si(100) islands
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
CRYSTAL ORIENTATION;
MOLECULAR BEAM EPITAXY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DOPING;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
WETTING;
COUPLED ARRAYS;
SEMICONDUCTING FILMS;
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EID: 0034446931
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-618-123 Document Type: Conference Paper |
Times cited : (2)
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References (13)
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