Current crowding and its effect on 1/f noise and third harmonic distortion - A case study for quality assessment of resistors

Microelectronics Reliability

Volumn 40, Issue 11, 2000, Pages 1847-1853

  Vandamme, E P ^a,c   Vandamme, L K J ^b  

^a IMEC   (Belgium)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISTORTION; GRAIN BOUNDARIES; HARMONIC ANALYSIS; NANOSTRUCTURED MATERIALS; RESISTORS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE; THICK FILMS; THIN FILMS;

INTER-GRAIN CONTACTS; THIRD HARMONIC DISTORTIONS;

MICROELECTRONICS;

EID: 0034325329     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(00)00091-3     Document Type: Article

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