메뉴 건너뛰기




Volumn 166, Issue 1, 2000, Pages 290-294

Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross-sectional Atomic Force Microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPRESSIVE STRESS; DEFORMATION; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; OXIDATION; RELAXATION PROCESSES; SEGREGATION (METALLOGRAPHY); SEMICONDUCTING INDIUM GALLIUM ARSENIDE; STRAIN; SUBSTRATES;

EID: 0034301320     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00410-4     Document Type: Article
Times cited : (10)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.