SCOPUS 정보 검색 플랫폼

Materials Science and Engineering B

Volumn 51, Issue 1-3, 1998, Pages 178-187

Characterization of quantum structures by atomic-force microscopy

(7) Wullner D a Schlachetzki, A a Bonsch P a Wehmann, H H a Schrimpf, T a Lacmann, R a Kipp, S a

a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG (Germany)

Author keywords

Atomic force microscopy; Calibration standards; InGaAs on InP; Quantum structures

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; HETEROJUNCTIONS; MEASUREMENT ERRORS; METALLORGANIC VAPOR PHASE EPITAXY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SURFACE STRUCTURE;

INDIUM GALLIUM ARSENIDE; QUANTUM STRUCTURES;

QUANTUM ELECTRONICS;

EID: 0031997272 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(97)00256-0 Document Type: Article

Times cited : (17)

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