Tutorial on built-in self-test. Part 2. Applications

IEEE Design and Test of Computers

Volumn 10, Issue 2, 1993, Pages 69-77

  Agrawal, Vishwani D ^a   Kime, Charles R ^a   Saluja, Kewal K ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL STORAGE; SEMICONDUCTOR STORAGE;

BUILT-IN SELF-TEST (BIST);

INTEGRATED CIRCUIT TESTING;

EID: 0027610022     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.211530     Document Type: Article

References (28)