A Tutorial on Built-ln Self-Test Part 1: Principles

IEEE Design and Test of Computers

Volumn 10, Issue 1, 1993, Pages 73-82

  Agrawal, Vishwani D ^a   Kime, Charles R ^b   Saluja, Kewal K ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; COMPUTER CIRCUITS; COSTS; DIGITAL CIRCUITS; INTEGRATED CIRCUIT TESTING;

BUILT IN SELF TEST; COMPUTER AIDED TESTING; DESIGN FOR TESTABILITY; TEST PATTERN GENERATION;

ELECTRONIC EQUIPMENT TESTING;

EID: 0027556721     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.199807     Document Type: Article

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