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Journal of Electronic Testing

Volumn 1, Issue 1, 1990, Pages 73-87

Design considerations for Parallel pseudoRandom Pattern Generators

(1) Bardell, Paul H a

a IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002279899 PISSN: 09238174 EISSN: 15730727 Source Type: Journal
DOI: 10.1007/BF00134016 Document Type: Article

Times cited : (27)

References (16)

1
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- B. Koenemann, J. Mucha, and G. Zwiehoff, “Built-in logic block observation techniques,” Proc. 1979 Test Conf., Cherry Hill, NJ, October, pp. 37–41.

2
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- P.H. Bardell and W.H. McAnney, “Self-testing of multi-chip logic modules,” Digest of Papers, 1982 IEEE Test Conf., Philadelphia, November 15–18, pp. 200–204.

3
- 0003972145
- Wiley, New York
- (1987) Built-in Test for VLSI , pp. 80
- Bardell, P.M.¹ McAnney, W.H.² Savir, J.³

4
- 0004201481
- Holden Day, San Francisco
- (1967) Shift Register Sequences
- Golomb, S.W.¹

5
- 84935058116
- P.H. Bardell, W.H. McAnney, and J. Savir, op. cit. Built-in Test for VLSI, Wiley, New York, 1987, p. 81.

6
- 0020708314
- Exhaustive generation of bit patterns with applications to VLSI self-testing
- (1983) IEEE Trans. Comput. , vol.100-132 , Issue.2 , pp. 190-194
- Barzilai, Z.¹ Coppersmith, D.² Rosenberg, A.³

7
- 84935088147
- D. Tang and C.L. Chen, “Logic test pattern generation using linear codes,” Proc. 13th Fault Tolerant Computing Symposium (FTCS-13), Milano, June 28–30, 1983, pp. 222–226.

8
- 0021785316
- Design of universal test sequences for VLSI
- (1985) IEEE Transactions on Information Theory , vol.31 IT , Issue.1 , pp. 10-17
- Lempel, A.¹ Cohn, M.²

9
- 84935123596
- Tech. Rep. 685, MIT Lincoln Laboratory, Lexington, MA
- (1984) VLSI self-testing using exhaustive bit patterns
- Dervisoglu, B.L.¹

10
- 0022866602
- Linear dependencies on linear feedback shift registers
- (1986) IEEE Trans. Comput. , vol.100-135 , Issue.12 , pp. 1086-1088
- Chen, C.L.¹

11
- 84935071465
- P.H. Bardell, W.H. McAnney, and J. Savir, op. cit. Built-in Test for VLSI, Wiley, New York, 1987, p. 87.

12
- 84935104699
- L.T. Wang and E.J. McCluskey, “A hybrid design of maximum-length sequence generators,” Proc. IEEE Intern. Test Conf., pp. 38–45, Washington, D.C., September 1986.

13
- 33747129507
- Ph.D. Dissertation, University of Manitoba, Winnipeg, Canada
- (1987) Parallel computation of non-deterministic algorithms in VLSI
- Hortensius, P.D.¹

14
- 84935140789
- P.H. Bardell, W.H. McAnney, and J. Savir, op. cit. Built-in Test for VLSI, Wiley, New York, 1987, p. 155.

15
- 84935067020
- Op. cit. p. 171.

16
- 0021468777
- Fast evaluation of logarithms in fields of characteristic two
- (1984) IEEE Transactions on Information Theory , vol.30 IT , Issue.4 , pp. 587-594
- Coppersmith, D.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.