Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method

Journal of the American Ceramic Society

Volumn 83, Issue 9, 2000, Pages 2282-2286

  Ortiz, Angel L ^a,b   Cumbrera, Francisco L ^a   Sánchez Bajo, Florentino ^a   Guiberteau, Fernando ^a   Xu, Huiwen ^b   Padture, Nitin P ^b  

^a UNIVERSITY OF EXTREMADURA   (Spain)

^b UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON CARBIDE; SINTERING; TEXTURES; X RAY CRYSTALLOGRAPHY;

BRAGG REFLECTIONS; LIQUID-PHASE-SINTERING; RIETVELD METHOD;

CERAMIC MATERIALS;

EID: 0034274218     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01548.x     Document Type: Article

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