Quantitative phase analysis of α- and β-silicon nitrides. II. Round robins

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 716-729

  Toraya, H ^a   Hayashi, S ^a,c   Nakayasu, T ^b  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^b UBE INDUSTRIES LTD   (Japan)

^c Mie Prefecture Industrial Research Institute   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000155619     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889899004227     Document Type: Article

References (7)

1. Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Nucl. Instrum. 3, 223-228.
2. Gazzara, C. P. & Messier, D. R. (1977). Am. Ceram. Soc. Bull. 56, 777-780.
3. Grün, R. (1979). Acta Cryst. B35, 800-804.
4. Kato, K., Inoue, Z., Kijima, K., Kawada, I., Tanaka, H. & Yamane, T. (1975). J. Am. Ceram. Soc. 58, 90-91.
5. Li, D. Y., O'Connor, B. H., Chen, Q. T. & Zadnik, M. G. (1994). J. Am. Ceram. Soc. 77, 2195-2198.
6. Reports for the Study on the Standardization for the Methods of Characterizing Fine Ceramics (1996). pp. 461-492. Tokyo: JFIS. (In Japanese.)
7. Reports for the Study on the Standardization for the Methods of Characterizing Fine Ceramics (1997). pp. 228-269. Tokyo: JFIS. (In Japanese.)