Quantitative phase analysis of α- and β-silicon nitrides. I. Estimation of errors

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 704-715

  Toraya, H ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000155618     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889899004215     Document Type: Article

References (9)

1. Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Nucl. Instrum. 3, 223-228.
2. Gazzara, C. P. & Messier, D. R. (1977). Am. Ceram. Soc. Bull. 56, 777-780.
3. Grün, R. (1979). Acta Cryst. B35, 800-804.
4. Hill, R. D. & Howard, C. J. (1985). J. Appl. Cryst. 18, 173-180.
5. Hill, R. D. & Howard, C. J. (1987). J. Appl. Cryst. 20, 467-474.
6. Imai, T., Hayashi, S. & Toraya, H. (1998). J. Ceram. Soc. Jpn, 106, 798-807. (In Japanese.)
7. Toraya, H. & Marumo, F. (1980). Reports Res. Lab. Engin. Mater. Tokyo Inst. Tech. 5, 55-64.
8. Toraya, H., Yoshimura, M. & Somiya, S. (1984). J. Am. Ceram. Soc. 67, C119-C121.
9. Ziegler, G., Heinrich, J. & Wötting, G. (1987). J. Mater. Sci. 22, 3041-3086.