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Volumn 228-231, Issue PART 1, 1996, Pages 177-182

Application of a new rietveld software for quantitative phase analysis and lattice parameter determination of AlN-SiC-Ceramics

Author keywords

Quantitative Analysis

Indexed keywords

ALUMINUM COMPOUNDS; ANISOTROPY; COMPUTER AIDED ANALYSIS; COMPUTER SIMULATION; COMPUTER SOFTWARE; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MONTE CARLO METHODS; SILICON CARBIDE; SINTERING; YTTRIUM COMPOUNDS;

EID: 0030384410     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (6)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.