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Volumn 228-231, Issue PART 1, 1996, Pages 177-182
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Application of a new rietveld software for quantitative phase analysis and lattice parameter determination of AlN-SiC-Ceramics
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Author keywords
Quantitative Analysis
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Indexed keywords
ALUMINUM COMPOUNDS;
ANISOTROPY;
COMPUTER AIDED ANALYSIS;
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
GRAIN SIZE AND SHAPE;
LATTICE CONSTANTS;
MONTE CARLO METHODS;
SILICON CARBIDE;
SINTERING;
YTTRIUM COMPOUNDS;
QUANTITATIVE PHASE ANALYSIS;
SOFTWARE PACKAGE REFINE;
CERAMIC MATERIALS;
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EID: 0030384410
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: None Document Type: Article |
Times cited : (6)
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References (7)
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