Atomic structure and properties of the (310) symmetrical tilt grain boundary (STGB) in SrTiO3. Part II: comparison with experimental studies

Interface Science

Volumn 8, Issue 2, 2000, Pages 177-187

  Dravid, Vinayak P ^a   Ravikumar, V ^a,b  

^a Northwestern University   (United States)

^b GENERAL ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ION BEAMS; OXYGEN; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC IMAGING; ATOMIC STRUCTURE; FOCUSED ION BEAM; SYMMETRICAL TILT GRAIN BOUNDARY;

GRAIN BOUNDARIES;

EID: 0034242076     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1008736805309     Document Type: Article

References (47)

1. W.E. King, G. Campbell, T. Gonis, G. Henshall, D. Lesuer, E. Zywicz, and S. Foiles, Materials Science and Engineering A 191, 1 (1995).
2. Advances in Ceramics, Vol. 1: Grain Boundary Phenomena in Electroceramics, edited by L.M. Levinson and D.C. Hill (American Ceramic Society, Columbus, OH, 1986); Ceramic Transactions, Vol. 41: Grain Boundaries and Interfacial Phenomena in Electronic Ceramics, edited by L.M. Levinson and S. Hirano (American Ceramic Society, Westerville, OH, 1994).
3. Advances in Ceramics, Vol. 1: Grain Boundary Phenomena in Electroceramics, edited by L.M. Levinson and D.C. Hill (American Ceramic Society, Columbus, OH, 1986); Ceramic Transactions, Vol. 41: Grain Boundaries and Interfacial Phenomena in Electronic Ceramics, edited by L.M. Levinson and S. Hirano (American Ceramic Society, Westerville, OH, 1994).
4. K.D. Johnson and V.P. Dravid, Interface Science, elsewhere in this issue.
5. V. Ravikumar and V.P. Dravid, Ultramicroscopy 52, 557 (1993).
6. M.M. McGibbon, N.D. Browning, M.F. Chisholm, A.J. McGibbon, S.J. Pennycook, V. Ravikumar, and V.P. Dravid, Science 266, 102 (1994).
7. N.D. Browning, J.P. Buban, H.O. Moltaji, S.J. Pennycoock, G. Duscher, K.D. Johnson, R.P. Rodrigues, and V.P. Dravid, Appl. Phys. Lett. 74, 2638 (1999).
8. V. Ravikumar, R.P. Rodrigues, and V.P. Dravid, Phys. Rev. Lett. 75, 4063 (1995).
9. V. Ravikumar, R.P. Rodrigues, and V.P. Dravid, J. Amer. Ceram. Soc. 80, 1117 (1997).
10. V. Ravikumar, R.P. Rodrigues, and V.P. Dravid, J. Amer. Ceram. Soc. 80, 1131 (1997).
11. R.P. Rodrigues, H. Chang, D.E. Ellis, and V.P. Dravid, J. Amer. Ceram. Soc. 82, 2373 (1999).
12. V. Ravikumar, D. Wolf, and V.P. Dravid, Interface Science, elsewhere in this issue.
13. O. Kienzle and F. Ernst, J. Amer. Ceram. Soc. 80, 1639 (1997).
14. O. Kienzle, M. Exner, F. Ernst, and M. Ruehle, Phys. Stat. Sol. A166, 57 (1998).
15. X. Pan, H. Gu, S. Stemmer, and M. Ruble, Mater. Sci. Forum 207, 421 (1996).
16. N.D. Browning, S.J. Pennycook, M.F. Chisholm, M.M. McGibbon, and A.J. McGibbon, Interface Science 2, 397 (1995).
17. D.A. Bonnell and I. Solomon, Ultramicroscopy 42, 778 (1992).
18. D.A. Bonnell, J. Amer. Ceram. Soc. 81, 3049 (1998).
19. J.C.H. Spence, Mater. Sci. & Engg. Reports R26, 1 (1999).
20. M. Vollmann and R. Waser, in Proceedings of the Fourth International Conference on Electronic Ceramics and Applications (Aachen, 1994), Vol. 1, p. 615.
21. V. Ravikumar, R.P. Rodrigues, and V.P. Dravid, J. Phys. D. Appl. Phys. 29, 1799 (1996).
22. S.J. Pennycook and L.A. Boatner, Nature 336, 565 (1988).
23. P.D. Nellist and S.J. Pennycook, Ultramicroscopy 78, 111 (1999).
24. N.D. Browning, M.F. Chisholm, and S.J. Pennycook, Nature 366, 143 (1993).
25. P.E. Batson, Nature 366, 727 (1993).
26. B. Rafferty and S.J. Pennycook, Ultramicroscopy 78, 141 (1999).
27. G. Duscher, N.D. Browning, and S.J. Pennycook, Phys. Stat. Sol. 166, 327 (1998).
28. N.D. Browning, J.P. Buban, C. Prouteau, G. Duscher, and S.J. Pennycook, Micron 30, 425 (1999).
29. K.L. Kliewer and J.S. Koehler, Phys. Rev. 140, A1226 (1965).
30. M.F. Yan, R.M. Cannon, and H.K. Bowen, J. Appl. Phys. 54, 764 (1983).
31. D. Wolf, J. Am. Ceram. Soc. 67, 1 (1984).
32. P.W. Tasker and D.M. Duffy, Phil. Mag. A 47, L45 (1983).
33. D. Wolf, in Mat. Res. Soc. Symp. Proc. (Elsevier Science Publishing Co., Inc., 1984), Vol. 24.
34. K.L. Merkle and D.J. Smith, Phys. Rev. Lett. 59, 2887 (1987); K.L. Merkle, and D.J. Smith, Ultramicroscopy 22, 57 (1987).
35. K.L. Merkle and D.J. Smith, Phys. Rev. Lett. 59, 2887 (1987); K.L. Merkle, and D.J. Smith, Ultramicroscopy 22, 57 (1987).
36. J.C.H. Spence, in Experimental High Resolution Electron Microscopy (Oxford University Press, NY, 1988).
37. H. Zhang, Y.Y. Wang, H. Zhang, V.P. Dravid, L.D. Marks, P.D. Han, D.A. Payne, and P.G. Radaelli, Nature 370, 352 (1994).
38. S.D. Mo, W.Y. Ching, M.F. Chisholm, and G. Duscher, Phys. Rev. B60, 24 (1999).
39. E.M. James and N.D. Browning, Ultramicroscopy 78, 125 (1999).
40. C. Kisielowski, E.C. Nelson, and C. Song, Microscopy and Microanalysis, in press.
41. J.C.H. Spence, Mater. Sci. & Engg. Reports R26, 1 (1999).
42. C. Herring, in Physics of Powder Metallurgy (McGraw-Hill Publ., NY, 1951).
43. T. Mori, H. Miura, T. Tokita, J. Haji, and M. Kato, Phil. Mag. Lett. 58, 11 (1988).
44. L.N. Brewer and V.P. Dravid, App. Phys. Lett., submitted, August 2000.
45. V. Ravikumar, D. Wolf, and V.P. Dravid, Phys. Rev. Lett. 74, 960 (1995).
46. J. Roder and A.M. Glaeser, J. Ceram. Soc. Jap. 99, 251 (1991).
47. M. Kitayama and A.M. Glaeser, Mater. Sci. Forum 207/209, 389 (1996).