Space-charge distribution across internal interfaces in electroceramics using electron holography: II, doped grain boundaries

Journal of the American Ceramic Society

Volumn 80, Issue 5, 1997, Pages 1131-1138

  Ravikumar, Venkataraman ^a,b   Rodrigues, Richard P ^a,b,c   Dravid, Vinayak P ^a,b  

^a Northwestern University   (United States)

^b AMERICAN CERAMIC SOCIETY   (United States)

^c Department of Physics ^*

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC CHARGE; GRAIN BOUNDARIES; HOLOGRAPHY;

DOPED GRAIN BOUNDARIES; ELECTROCERAMICS; ELECTRON HOLOGRAPHY; SPACE CHARGE DISTRIBUTION;

CERAMIC MATERIALS;

EID: 0031142868     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb02955.x     Document Type: Article

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