Chemical microanalysis by selected-area ESCA using an electron energy filter in a photoemission microscope

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 1009-1014

  Schmidt, O ^a   Ziethen, Ch ^a   Fecher, G H ^a   Merkel, M ^b   Escher, M ^b   Menke, D ^c   Kleineberg, U ^c   Heinzmann, U ^c   Schonhense G ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b FOCUS GmbH   (Germany)

^c BIELEFELD UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004809331     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00279-x     Document Type: Article

References (7)

1. M.R. Weiss, V. Wustenhagen, R. Fink, E. Umbach, J. Electron Spectrom. Related Phenom. 84 (1-3) (1997) 9-28.
2. H. Ade (ed.), J. Electron Spectrom. Related Phenom., 84 (1997), Special Volume on Spectromicroscopy.
3. Ch. Ziethen, O. Schmidt, G.H. Fecher, CM. Schneider, G. Schönhense, R. Frömter, M. Seider, K. Grzelakoski, M. Merkel, D. Funnemann, W. Swiech, H. Gundlach, J. Kirschner, this volume.
4. U. Kleineberg, K. Osterried, H.J. Stock, D. Menke, B. Schmiedeskamp, D. Fuch, P. Müller, F. Scholze, K.F. Heidemann, B. Nelles, U. Heinzmann, Appl. Optics 34 (28) (1995) 6506-6512.
5. H.J. Stock, F. Hamelmann, U. Kleineberg, D. Menke, B. Schmiedeskamp, K. Osterried, K.F. Heidemann, U. Heinzmann, Appl. Optics 36 (7) (1997) 1650-1654.
6. F. Steglich, P. Hellmann, S. Thomas, P. Gegenwart, A. Link, R. Helfrich, G. Sparn, M. Lang, C. Geibel, W. Assmus, Physica B 237 (1997) 192-196.
7. T. Fukuhara, K. Maezawa, H. Ohkuni, J. Sakurai, H. Sato, H. Azuma, K. Sugiyama, Y. Onuki, K. Kindo, J. Phys. Soc. Jap. 65 (6) (1996) 1559-1561.