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Volumn 49, Issue 6, 2000, Pages 532-541

Incorporating yield enhancement into the floorplanning process

Author keywords

[No Author keywords available]

Indexed keywords

FLOORPLANNING;

EID: 0034205833     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.862213     Document Type: Article
Times cited : (18)

References (17)
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  • 6
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    • A Statistical Study of Defect Maps of Large Area VLSI ICs
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    • I. Koren, Z. Koren, and C.H. Stapper, "A Statistical Study of Defect Maps of Large Area VLSI ICs," IEEE Trans. VLSI Systems, vol. 2, pp. 249-256, June 1994.
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    • Koren, I.1    Koren, Z.2    Stapper, C.H.3
  • 8
    • 0032164444 scopus 로고    scopus 로고
    • Defect Tolerant VLSI Circuits: Techniques and Yield Analysis
    • Sept.
    • I. Koren and Z. Koren, "Defect Tolerant VLSI Circuits: Techniques and Yield Analysis," Proc. IEEE, vol. 86, pp. 1,817-1,836, Sept. 1998.
    • (1998) Proc. IEEE , vol.86
    • Koren, I.1    Koren, Z.2
  • 10
    • 0031098217 scopus 로고    scopus 로고
    • On the Effect of Floorplanning on the Yield of Large Area Integrated Circuits
    • Mar.
    • Z. Koren and I. Koren, "On the Effect of Floorplanning on the Yield of Large Area Integrated Circuits," IEEE Trans. VLSI Systems, vol. 5, pp. 3-14, Mar. 1997.
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  • 11
  • 12
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    • Defect Density Distribution for LSI Yield Calculations
    • July
    • C.H. Stapper, "Defect Density Distribution for LSI Yield Calculations," IEEE Trans. Electron Devices, vol. 20, pp. 655-657, July 1973.
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    • Stapper, C.H.1
  • 13
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    • A 1-Gb DRAM for File Applications
    • Nov.
    • T. Sugibayashi et al., "A 1-Gb DRAM for File Applications," IEEE J. Solid-State Circuits, vol. 30, pp. 1,277-1,280, Nov. 1995.
    • (1995) IEEE J. Solid-State Circuits , vol.30
    • Sugibayashi, T.1
  • 14
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    • Analysis of Strategies for Constructive General Block Placement
    • Mar.
    • S. Wimer and I. Koren, "Analysis of Strategies for Constructive General Block Placement," IEEE Trans. Computer-Aided Design, vol. 7, pp. 371-377, Mar. 1988.
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  • 16
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    • Feb.
    • T. Yamagata et al., "A Distributed Globally Replaceable Redundancy Scheme for Sub-Half-Micron ULSI Memories and Beyond," IEEE J. Solid-State Circuits, vol. 31, pp. 195-201, Feb. 1996.
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  • 17
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    • Nov.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.