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Volumn 44, Issue 2, 2000, Pages 253-257

Simulation of the electrical characteristics of AlGaN/GaN heterojunction bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; COMPUTER SIMULATION; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; EMITTER COUPLED LOGIC CIRCUITS; FREQUENCY RESPONSE; HIGH FREQUENCY AMPLIFIERS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; TWO DIMENSIONAL;

EID: 0034140093     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00231-2     Document Type: Article
Times cited : (15)

References (18)
  • 4
    • 49149141662 scopus 로고
    • Specific contact resistance using a circular transmission line model
    • Reeves G.K. Specific contact resistance using a circular transmission line model. Solid-State Electron. 23:1979;487-490.
    • (1979) Solid-State Electron. , vol.23 , pp. 487-490
    • Reeves, G.K.1
  • 5
    • 0000779101 scopus 로고    scopus 로고
    • Novel AlN/GaN insulated gate heterostructure field effect transistor with modulation doping and one-dimensional simulation of charge control
    • Imanaga S., Kawai H. Novel AlN/GaN insulated gate heterostructure field effect transistor with modulation doping and one-dimensional simulation of charge control. J. Appl. Phys. 82:1997;5843-5858.
    • (1997) J. Appl. Phys. , vol.82 , pp. 5843-5858
    • Imanaga, S.1    Kawai, H.2
  • 14
    • 5244278122 scopus 로고    scopus 로고
    • Electron mobility in two-dimensional electron gas in AlGaN/GaN heterostructures and in bulk GaN
    • Shur M., Gelmont B., Khan M.A. Electron mobility in two-dimensional electron gas in AlGaN/GaN heterostructures and in bulk GaN. J. Electron. Mater. 25:1996;777-785.
    • (1996) J. Electron. Mater. , vol.25 , pp. 777-785
    • Shur, M.1    Gelmont, B.2    Khan, M.A.3
  • 18
    • 0001323827 scopus 로고    scopus 로고
    • Temperature dependence of impact ionization in AlGaN-GaN heterostructure field effect transistors
    • Dyakonova N., Dickens A., Shur M.S., Gaska R., Yang J.W. Temperature dependence of impact ionization in AlGaN-GaN heterostructure field effect transistors. Appl. Phys. Lett. 72:1998;2562-2564.
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 2562-2564
    • Dyakonova, N.1    Dickens, A.2    Shur, M.S.3    Gaska, R.4    Yang, J.W.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.