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Volumn 69, Issue , 2000, Pages 536-541

Structure of microcrystalline silicon films deposited at very low temperatures by hot-wire CVD

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; GRAIN BOUNDARIES; OXIDATION; PASSIVATION; SEMICONDUCTING SILICON;

EID: 0033895971     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00319-0     Document Type: Article
Times cited : (2)

References (19)
  • 7
    • 85031596398 scopus 로고    scopus 로고
    • Ph. D. Thesis, University of Barcelona
    • D. Peiró, Ph. D. Thesis, University of Barcelona, 1999.
    • (1999)
    • Peiró, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.