The annealing effect on the electrical property of the Al/undoped diamond film

Diamond and Related Materials

Volumn 9, Issue 1, 2000, Pages 73-81

  Huang, Bohr Ran ^a   Wu, Chia Haur ^a   Sheu, Rong Fu ^a  

^a NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Annealed undoped diamond; Bulk diamond crystallites; Diamond grain boundaries; Schottky diode

Indexed keywords

ALUMINUM; ANNEALING; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CONTACTS; ELECTROMIGRATION; GRAIN BOUNDARIES; OXIDATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; SCHOTTKY BARRIER DIODES; SILICON WAFERS;

SCHOTTKY CONTACTS;

DIAMOND FILMS;

EID: 0033887523     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(99)00235-6     Document Type: Article

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