Internal interfaces and intrinsic stress in thin amorphous Cu-Ti and Co-Tb films

Journal of Applied Physics

Volumn 83, Issue 6, 1998, Pages 3065-3070

  Geyer, U ^a   Von Hulsen U ^a   Kopf, H ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011880778     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367061     Document Type: Article

References (27)

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