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Volumn 44, Issue 7, 2000, Pages 1281-1287

Numerical simulation of small-signal microwave performance of 4H-SiC MESFET

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; FREQUENCY DOMAIN ANALYSIS; SEMICONDUCTING SILVER COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SILICON CARBIDE;

EID: 0033742513     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00025-3     Document Type: Article
Times cited : (7)

References (40)
  • 25
    • 0343436709 scopus 로고
    • Physical models for silicon VLSI
    • In: Snowden CM, editor Berlin: Springer
    • Selberherr S. Physical models for silicon VLSI. In: Snowden CM, editor. Semiconductor device modeling. Berlin: Springer, 1989.
    • (1989) Semiconductor Device Modeling
    • Selberherr, S.1
  • 40
    • 0011715872 scopus 로고
    • Electrical characterization of interface states at Schottky contacts and MIS tunnel diodes
    • New York: Plenum Press
    • Werner J. Electrical characterization of interface states at Schottky contacts and MIS tunnel diodes. In: Metallization and metal-semiconductor interfaces. New York: Plenum Press, 1988.
    • (1988) In: Metallization and Metal-semiconductor Interfaces
    • Werner, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.