Suppression of dewetting in nanoparticle-filled polymer films

Macromolecules

Volumn 33, Issue 11, 2000, Pages 4177-4185

  Barnes, Kathleen A ^a   Karim, Alamgir ^a   Douglas, Jack F ^a   Nakatani, Alan I ^a   Gruell, Holger ^a   Amis, Eric J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FULLERENES; NEUTRON REFLECTION; PLASTICS FILLERS; POLYBUTADIENES; POLYSTYRENES; SILICON WAFERS; SURFACE PROPERTIES; SURFACE ROUGHNESS; WETTING;

DEWETTING; POLYMER FILM; SPIN CASTING;

THIN FILMS;

EID: 0033737851     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma990614s     Document Type: Article

References (40)

1. Lisari, J. J. Plastic Coatings for Electronics; McGraw-Hill: New York, 1970.
2. Cowie, J. M. G. Polymer: Chemistry and Physics of Modern Materials; Chapman and Hall: New York, 1970.
3. Wu, S. Polymer Interfaces and Adhesion; Marcel Dekker: New York, 1982.
4. Reiter, G. Phys. Rev. Lett. 1992, 68, 75; Langmuir 1993, 9, 1344; Macromolecules 1993, 27, 3046.
5. Reiter, G. Phys. Rev. Lett. 1992, 68, 75; Langmuir 1993, 9, 1344; Macromolecules 1993, 27, 3046.
6. Reiter, G. Phys. Rev. Lett. 1992, 68, 75; Langmuir 1993, 9, 1344; Macromolecules 1993, 27, 3046.
7. Herminghaus, S.; Jacobs, K.; Mecke, K.; Bischof, J.; Fery, A.; Ibn-Elhaj, M.; Schlagowski, S. Science 1998, 282, 916.
8. Xie, R.; Karim, A.; Douglas, J. F.; Han, C. C.; Weiss, R. A. Phys. Rev. Lett. 1998, 81, 1251.
9. Vrij, A. Discuss. Faraday Soc. 1966, 42, 23.
10. Brochard-Wyart, F.; Dalliant, J. Can. J. Phys. 1990, 68, 1084.
11. Yerushalmi-Rozen, R.; Klein, J.; Fetters, L. J. Science 1994, 263, 793. See ref 34.
12. Feng, Y.; Karim, A.; Weiss, R. A.; Douglas J. F.; Han, C. C. Macromolecules 1998, 31, 484.
13. Henn, G.; Bucknall, D. G.; Stamm, M.; Vanhoorne, P.; Jerome, R. Macromolecules 1996, 29, 4305.
14. Kerle, T.; Yersushalmi-Rozen, R.; Klein, J.; Fetters, L. J. Europhys. Lett. 1998, 44, 484.
15. Barnes, K. A.; Douglas, J. F.; Karim, A.; Liu, D.-W.; Amis, E. J. Polym. Int., in press.
16. Hahn, F. J. J. Paint Technol. 1971, 43, 58.
17. Kornum, L. O.; Nielsen, H. K. R. Prog. Org. Coat. 1980, 8, 275.
18. Stange, T. G.; Evans, D. F.; Hendrickson, W. A. Langmuir 1997, 13, 4459.
19. Jacobs, K.; Herminghaus, S.; Mecke, K. R. Langmuir 1998, 14, 965.
20. Certain commercial materials and instruments are identified in this article to adequately specify the experimental procedure. In no case does such identification imply recommendation or endorsement by the NIST nor does it imply that materials or equipment identified are necessarily the best available for the purpose.
21. r,w. The conventional notation, rather than the ISO notation, has been employed for this article.
22. filler = 0.01 refers to the filler mass fraction relative to the polymer mass in solution.
23. Russell, T. P.; Karim, A.; Mansour, A.; Felcher, G. P. Macromolecules 1998, 21, 1890.
24. Zolotukhin, I. V.; Yanchenko, L. I.; Belonnogov, E. K. JETP 1998, 67, 720.
25. Average hole sizes were determined by measuring a minimum of 20 randomly selected holes for each optical image. Error estimations are based upon three average hole size calculations obtained from independent measurements.
26. Onda, T.; Shibuichi, S.; Satoh, N.; Tsuji, K. Langmuir 1996, 12, 2125.
27. Ying, Q.; Merecek, J.; Chu, B. J. Chem. Phys. 1994, 101, 2665.
28. Joanny, J. F.; de Gennes, P. G. J. Chem. Phys. 1984, 81, 552.
29. de Gennes, P. G. Rev. Mod. Phys. 1985, 57, 827.
30. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389, 827. Decker, E. L.; Garoff, S. Langmuir 1997, 73, 6321. Deegan, R. D. Ph.D. Dissertation, Department of Physics, University of Chicago, 1998.
31. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389, 827. Decker, E. L.; Garoff, S. Langmuir 1997, 73, 6321. Deegan, R. D. Ph.D. Dissertation, Department of Physics, University of Chicago, 1998.
32. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389, 827. Decker, E. L.; Garoff, S. Langmuir 1997, 73, 6321. Deegan, R. D. Ph.D. Dissertation, Department of Physics, University of Chicago, 1998.
33. Cole, D. H.; Shull, K. R.; Baldo, P.; Rehn, L. Macromolecules 1991, 32, 771.
34. Ohara, P. C.; Gelbart, W. M. Langmuir 1998, 14, 3418.
35. Kerle, T.; Yerushalmi-Rozen, R.; Klein, J. Europhys. Lett. 1997, 38, 207.
36. Karim, A.; Tsukruk, V. V.; Douglas, J. F.; Satija, S. K.; Fetters, L. J.; Reneker, D. H.; Foster, M. D. J. Phys. (Paris) 1995, 5, 1441.
37. Garoff, S. Europhys. Lett. 1992, 20, 528.
38. Netz, R. R.; Andelman, D. Phys. Rev. E 1997, 55, 687.
39. Petralli-Mallow, T.; Woodward, J.; Elliot, J., Biotechnology Division, NIST, personal communication. These measurements were suggested by one of the authors (Douglas) as a generalization of the present measurements on synthetic polymers containing filler particles.
40. Karim, A.; Douglas, J. F.; Liu, D.-W., manuscript in preparation.